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Ametek VersaSCAN OSP Non-contact Optical Surface Profiling

Ametek Scientific Instruments

More Products by Ametek Scientific Instruments
Solution Type: Scanning Electrochemical Systems

The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.

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  • Optical Surface profiling technique to measure topography of sample
  • Can be combined with other VersaScan techniques for constant distance mode mapping

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