The latest generation ModuLab® XM MTS system is designed with modularity and flexibility in mind to allow for a wide range of applications. Purpose built for materials test research the ModuLab XM provides:
- I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
- P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials)
- High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
- Staircase and smooth stepless analog ramp waveforms
- Impedance, admittance, permittivity / capacitance, electrical modulus
- C-V capacitance - voltage, Mott-Schottky
- Automatic sequencing of time domain and impedance/capacitance measurements
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- Widest impedance range - µohms to >100 Tohms
- Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measur...
- Low frequency to 10 µHz for degradation, trap state and material purity studies
- Plug and Play options include – Femto and Sample/Reference modes (for dielectric/insulators)
| The ModuLab XM is a modular system that can be configured for the following applications: | |
| Dielectric Materials- | Ferro/piezoelectrics | MEMs | NEMs| multiferroics | polymers |solid oxides SOFC | ionic conductors | solid electrolytes, quantum dots |
| Electronic Materials - | LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials |
