Ametek ModuLab XM MTS – Materials Test System

Ametek ModuLab XM MTS - Materials Test System

Ametek Scientific Instruments

More Products by Ametek Scientific Instruments
Solution Type: Material Test Systems
pi modulab xm ecs 215

The latest generation ModuLab® XM MTS system is designed with modularity and flexibility in mind to allow for a wide range of applications. Purpose built for materials test research the ModuLab XM provides:

  • I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
  • P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials)
  • High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
  • Staircase and smooth stepless analog ramp waveforms
  • Impedance, admittance, permittivity / capacitance, electrical modulus
  • C-V capacitance - voltage, Mott-Schottky
  • Automatic sequencing of time domain and impedance/capacitance measurements
ModuLab XM MTS is able to auto-sequence all of the above techniques for charge carrier activation and analysis, without changing sample connections. Temperature control is also built into the software via cryostats, furnaces and probe stations.

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  • Widest impedance range - µohms to >100 Tohms
  • Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measur...
  • Low frequency to 10 µHz for degradation, trap state and material purity studies
  • Plug and Play options include – Femto and Sample/Reference modes (for dielectric/insulators)
The ModuLab XM is a modular system that can be configured for the following applications:
Dielectric Materials- Ferro/piezoelectrics | MEMs | NEMs| multiferroics | polymers |solid oxides SOFC | ionic conductors | solid electrolytes, quantum dots
Electronic Materials - LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials

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