Ametek Materials Lab XM

Ametek Materials Lab XM

Manufacturer:
Ametek Scientific Instruments

More Products by Ametek Scientific Instruments
Solution Type: Material Test Systems
materials lab xm 215

Materials Lab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on materials research. The Materials Lab XM product provides a fully integrated reference grade time domain and AC measurement platform. No need to switch sample connections between techniques. Time domain measurements include I-V (current voltage) characterization as well as fast pulse techniques. AC testing techniques include everything from single-sine analysis, to multisine / Fast Fourier Transform for faster low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. Measurements of electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance are all provided from the XM-studio MTS software platform, together with integrated equivalent circuit analysis functionality. Time domain and AC tests can be combined in test sequences and instantly switched, allowing DC and pulse waveforms to activate charge carriers, followed immediately by EIS analysis of the activated carriers. This closely linked integration is only with the Materials Lab XM. Measurements include:

  • I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
  • P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials)
  • High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
  • Staircase and smooth stepless analog ramp waveforms
  • Impedance, admittance, permittivity / capacitance, electrical modulus
  • C-V capacitance - voltage, Mott-Schottky
  • Automatic sequencing of time domain and impedance/capacitance measurements



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  • Highest accuracy DC (IV, fast pulse) and EIS (C-V, impedance, Mott-Schottky)
  • Instant switching between DC and EIS - without changing sample connections
  • Low frequency to 10 µHz for degradation, trap state and material purity studies
  • Multiple AC techniques include single sine, harmonic analysis (non-linear materials), multisine for faster low frequency tests


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